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1·Some problems in logic cluster boundary scan test could not be neglected.

逻辑簇的边界扫描测试存在一些不可忽视的重要问题。

2·A switch is used to change from the parallel test mode to the scan test mode.

开关用于从并行测试方式改变为扫描测试方式。

3·There are some common methods of design for testability, such as boundary scan test and so on.

目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。

4·The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks.

兼容于BSDL和EDIF文件格式的自动测试向量生成软件可实现多种扫描测试功能。

5·In this paper, the theory and architecture of boundary scan test technology is introduced and researched, then its application is given.

研究了目前较常用的边界扫描测试技术的原理、结构，并给出了边界扫描技术的应用。

6·This paper Outlines the design of features related to test and then details the Boundary Scan test strategies developed for different MCM.

本文概要论及与测试相关的设计特性，详细讨论了不同MCM的边界扫描测试策略。

7·Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.

另外，本文还针对IP核投片测试提出一种扫描测试电路结构，能够实现测试芯片的扫描测试和高速内建自测试(BIST)。

8·In the end, the boundary scan test technology is introduced as the useful complement to functional self-test method, which can improve the fault isolation rate.

最后介绍了边缘扫描测试技术，指出边缘扫描测试技术是功能自测试方法的有益补充，能够有效提高测试的故障隔离率。

9·A scan test scheme based on scan chain disabling technique has been proposed, which can effectively reduce test power. However, its test application time is long.

一种基于扫描链阻塞技术的扫描测试结构被提出来，该结构有效地降低了测试功耗，但其测试应用时间较长。

10·Many in-circuit testers now have boundary-scan test capability. With boundary-scan testing, you can test interconnections on PCBs without using a probe on each node.

很多测试设备具有分界扫描的功能，这样，测试人员就可以直接测试印刷电路板上的互连，而没用必要使用探针去测试每一个节点了。