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1·In this paper, Focused Ion Beam Lithography technology and is introduced.

对聚焦离子束曝光技术作了介绍。

2·A simple and practical single-lens focused ion beam (FIB) System has been built.

建立了一台简单实用的单级透镜聚焦离子束(FIB)系统。

3·In this paper, Development of liquid metal ion source for nanometer focused ion beam system is introduced.

叙述了为纳米聚焦离子束装置研制的镓液态金属离子源的制备。

4·The ion beam optics of a microwave ion gun for a focused ion beam (FIB) system is investigated numerically in this article.

用数值模拟方法研究了聚焦离子束系统中微波离子枪的束光学性能。

5·The holograms were fabricated using a very finely focused ion beam to cut a pattern of extremely small slits just 20 nm across through a thin silicon membrane 30 nm thick.

全息图是用精细聚焦的离子束在一片30 n m厚的薄硅膜上切割出20nm长的极小的裂纹的图案组合而成的。

6·In most of the experiments reported to date, the perforated metal films were fabricated by the focused-ion-beam method, and their transmission enhancement was in the visible and near-infrared regions.

根据目前的实验研究报道，这种周期结构金属薄膜通常利用聚焦离子束刻蚀工艺来获得，器件的光学响应在可见光波段和近红外波段。

7·If there was a problem with the chip, you could probe the metal directly to watch the circuitry, and, with a focused-ion-beam system, you could even rewire it.

如果芯片有问题，应该直接研究金属层来察看电路，而对于聚焦离子束系统则应该重新布线。